Scanning Electrochemical Microscopy

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• scanning electrochemical microscopy — elektrocheminė skenuojamoji mikroskopija statusas T sritis chemija apibrėžtis Pavienių molekulių tyrimo metodas, pagrįstas su molekule susiduriančių elektronų perdavimo mikroelektrodui detektavimu. atitikmenys: angl. scanning electrochemical… …   Chemijos terminų aiškinamasis žodynas

• scanning electrochemical microscopy — rastrinė elektrocheminė mikroskopija statusas T sritis chemija apibrėžtis Elektrocheminių reakcijų tarpinių produktų tyrimo metodas. atitikmenys: angl. scanning electrochemical microscopy rus. растровая электрохимическая микроскопия …   Chemijos terminų aiškinamasis žodynas

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

• Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …   Wikipedia

• Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography …   Wikipedia

• Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… …   Wikipedia

• Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… …   Wikipedia

• Microscope — This article is about microscopes in general. For light microscopes, see optical microscope. Microscope Us …   Wikipedia

• Allen J. Bard — (* 18. Dezember 1933 in New York City) ist ein US amerikanischer Chemiker, der sich vor allem mit Elektrochemie befasst. Bard besuchte 1948 bis 1951 die Bronx High School of Science, studierte am City College of New York (Bachelor Abschluss 1955) …   Deutsch Wikipedia